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Industrial Metrology cameras for increased performance of process control systems

Posted by Gretchen Alper on Wed, Jul 16, 2014

In our post about detecting smaller features with metrology cameras, we made the designation between mainstream machine vision cameras and industrial metrology cameras. [See slide 7 in Yole Developpement's Machine Vision Market report presentation].  Here are some more details on when a metrology camera will provide a performance advantage.

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Topics: Vision System Optimization

Increase Accuracy of Optical 3D Measurements

Posted by Gretchen Alper on Wed, Jul 9, 2014

In semiconductor and electronics manufacturing, there has been a move towards 3D measurements to provide accurate process control of smaller dimensions for higher yield and quality of new packaging technologies.  For example in electronics manufacturing a 2D view from the top only allows for detection of defects such as shifts, rotations, and cracks, but not whether components are flat on the board or the volume of solder paste.

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Topics: Applications, Vision System Optimization

Detect smaller features with metrology cameras

Posted by Gretchen Alper on Thu, Jul 3, 2014

As chipmakers continue to move to smaller technology nodes, there are greater demands on process control systems to inspect and measure smaller features and components.

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Topics: Vision System Optimization

OEM camera considerations for tool matching and increased system up time

Posted by Gretchen Alper on Tue, Jun 24, 2014

Once you have determined the right camera parameters that provide the necessary image information for your measurement, there are a few more considerations that can affect the overall performance of the system.  The cameras also needs to meet incoming supplier inspection requirements such as cleanliness, not require extended set-up time, enable tool matching and easy replacement in the field, and not impact the system up time.  These extra factors will help with some of those intangibles that come with critical component selection and as a bonus make your coworkers a little happier.

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Topics: Vision System Optimization

Ways to increase throughput in semiconductor and electronics inspection

Posted by Gretchen Alper on Fri, Jun 13, 2014

The constant challenge in semiconductor and electronics manufacturing is to increase throughput while also increasing accuracy with shrinking dimensions.  This means in-line inspection and metrology systems must provide 100% analysis at a high precision while maintaining high throughput.  The latest innovations in ultra high-resolution image sensors and subsequent cameras support these goals.  High resolution, high-speed metrology cameras enable greater throughput in semiconductor or electronics inspection and metrology systems through:

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Topics: Vision System Optimization

Future Machine Vision Systems Require a New Approach

Posted by Gretchen Alper on Wed, May 14, 2014

Machine vision has gone beyond factory automation and process control to nanoscale measurements and even global security systems.  Despite this, the considerations for machine vision camera options are often still just resolution, frame speed, and price.

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Topics: Vision System Optimization

HD daylight full motion video cameras now fill the low light identification gap

Posted by Gretchen Alper on Tue, Apr 29, 2014

In defense and global security electro-optical systems whether for surveillance, situational awareness, or targeting, daylight cameras are combined with cameras optimized for other portions of the light spectrum such as a Long Wave Infrared LWIR (thermal) camera, a NIR camera (low light) and a SWIR camera to obtain full motion video throughout the day and night. The thermal camera or image-intensified camera allows the operator to easily detect anomalies in a scene. Other cameras such as the SWIR or the visible camera can then be used to recognize or identify the anomalies.

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Topics: Applications, Vision System Optimization

Binning to increase SNR and frame rate with CCD and CMOS industrial cameras

Posted by Gretchen Alper on Wed, Jan 15, 2014

There are always small changes (at no additional product cost) that can be made to increase the performance of your machine vision camera and thus to your overall inspection or metrology system.  Binning is one example.  There has been a trend with latest generation image sensors to increase resolution while also reducing the pixel size at the expense of some other performance parameters. If you do not need all of the resolution provided, but require better signal to noise ratio for instance, then binning is an easy solution.  Here we will discuss binning with CCD cameras (interline transfer image sensor technology).  For more information on binning with CMOS cameras, please see a previous post.

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Topics: Vision System Optimization, Sensor Technology

20+ Tips to help you select the best industrial camera

Posted by Gretchen Alper on Mon, Dec 30, 2013

There are many considerations as you decide on the best machine camera whether it is for an upgrade to an existing system or for a new project.   Here are some recent blog posts to help you with the process:

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Topics: Vision System Optimization

Dynamic Range (DNR) and Signal to Noise Ratio (SNR) for CCD and CMOS image sensors

Posted by Gretchen Alper on Mon, Oct 7, 2013

The capability of a machine vision camera to capture the details of a scene is defined by several parameters with dynamic range at the top of the list.  High contrast images require a high dynamic range.  One problem is there can be different ways to calculate dynamic range, which makes it difficult to compare cameras and sensors on paper.  Also, dynamic range and the signal to noise ratio (SNR) are sometimes considered interchangeable for CCD and CMOS image sensors and cameras providing further confusion. 

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Topics: Vision System Optimization, CCD vs. CMOS